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Metal Foil Resistors

Name: China Metal Foil Resistors Manufacturers Suppliers Factory - Metal Foil Resistors for Sale
Brand: Tiangeng
SKU: 272302626

Product images and dimensions This product is a new type of resistor produced using semiconductor technology. The product has small size, high accuracy, low temperature coefficient, good stability, and high reliability, and is widely used in military inertial navigation distribution control,...

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Description

Product images and dimensions

This product is a new type of resistor produced using semiconductor technology. The product has small size, high accuracy, low temperature coefficient, good stability, and high reliability, and is widely used in military inertial navigation distribution control, various industrial instruments, and precision measurement systems for instruments due to its good electrical characteristics.

Jining Tiangeng Electric Co., Ltd.
http://www.jntgdq.com

Metal Foil Resistor Experimental Report

Experiment Personnel: Data Verification: Wang Yanfeng, Zhou Yujiao, Yan Rui
Approval: Lv Liqing
Date: December 26, 2024

I. Experiment Purpose:
According to product requirements, in conjunction with national standard GB5735-2007 and U.S. military standard MIL-STD-202 METHOD 108 specifications, 50 finished products were randomly selected for short-term overload, high-temperature exposure, random vibration, high-frequency vibration, soldering heat resistance, moisture resistance, temperature shock, temperature coefficient, and electrical aging working life tests. The goal is to evaluate changes in the electrical performance of the products.

II. Scope:
This experiment applies to all metal foil resistor testing specifications at Jining Tiangeng Electric.

III. Reference Documents:
3.1 SJ51862/1-2004 Detailed Specification for Precision Metal Foil Fixed Resistors with Reliability Indicators
3.2 GJB1862-1994 General Specification for Precision Fixed Resistors with Reliability Indicators
3.3 High Stability Fixed Resistor General Specification GJB1929-1994 (U.S. Military Standard MIL-R-10509), MIL-STD-202 Method 108

IV. Equipment/Instruments/Tools:

High-low temperature alternating test chamber

Calibrated thermometer

TH0370 low-resistance DC tester

Precision constant current source

3458A, 34420A multimeters

High-temperature resistant gloves

V. Experiment Content

1. High-Temperature Exposure Test

Experiment Purpose: To clarify the structural and material performance of the product.

High-Temperature Aging: Electronic products are placed in a set high-temperature environment of 150°C for 24 hours, then naturally cooled, observing and recording performance changes.

Serial Number	R0 (10KΩ) (KΩ)	R1 (10KΩ) (KΩ)	Change Rate (%)	R0 (10Ω) (Ω)	R1 (10Ω) (Ω)	Change Rate (%)
1	10.00082	10.000633	-0.0019	9.8212	9.8209	-0.0031
2	10.00102	10.000972	-0.0005	9.8318	9.8309	-0.0092
3	10.00047	10.000285	-0.0018	9.8438	9.844	0.0020
4	10.00063	10.000381	-0.0025	9.8479	9.847	-0.0091
5	10.00085	10.000644	-0.0021	9.9544	9.9545	0.0010

2. Soldering Heat Resistance Test for RJ711 Product

Experiment Purpose: To clarify the soldering heat resistance performance of the product.

Method: According to GJB360.20-87, the dip soldering method directly immerses the resistor's soldering end in a 235°C solder pot for 2-3 seconds to evaluate its heat resistance during high-temperature soldering.

Serial Number	R0 (10KΩ) (KΩ)	R1 (10KΩ) (KΩ)	Change Rate (%)	R0 (10Ω) (Ω)	R1 (10Ω) (Ω)	Change Rate (%)
1	10.0004	10.0003	-0.0010	10.0017	10.001	-0.0070
2	10.0003	10.0003	0.0000	10.0016	10.0015	-0.0010
3	10	9.9999	-0.0010	10.002	10.0025	0.0050
4	10.0001	9.9999	-0.0020	10.0016	10.0013	-0.0030
5	10.0003	10.0002	-0.0010	10.0023	10.0018	-0.0050

Serial Number	R0 (1KΩ) (KΩ)	R1 (1KΩ) (KΩ)	Change Rate (%)
1	1.000053	1.000055	0.0002
2	1.00005	1.000048	-0.0002
3	1.000019	1.000006	-0.0013
4	1.000015	1.000014	-0.0001
5	0.999977	0.999968	-0.0009

3. Temperature Characteristic Test for RJ711 Product

Experiment Purpose: To clarify the temperature coefficient characteristics of the product.

Data: The product's temperature coefficient was tested from -55°C to 25°C and from 25°C to 125°C. All data were measured after soldering.

Serial Number	25°C (10KΩ)	-55°C (10KΩ)	TCR(-)	125°C (10KΩ)	TCR(+)	25°C (Rechecked) (10KΩ)
1	10.0003	10.0005	-0.26	9.9971	-3.24	10.0004
2	10.0003	10.0005	-0.24	9.9965	-3.89	10.0004
3	9.9999	9.9999	0.06	9.9965	-3.43	10.0000
4	9.9999	9.9999	0.06	9.9968	-3.31	9.9999
5	10.0002	9.9992	1.24	9.9973	-2.97	10.0003

Serial Number	25°C (10Ω)	-55°C (10Ω)	TCR(-)	125°C (10Ω)	TCR(+)	25°C (Rechecked) (10Ω)
1	10.0010	9.9978	4.00	10.0028	0.40	10.0024
2	10.0015	9.9977	4.75	10.0023	-0.60	10.0029
3	10.0025	9.9986	4.87	10.0045	2.40	10.0021
4	10.0013	9.9976	4.74	10.0017	-0.40	10.0021
5	10.0018	9.9970	6.00	10.0058	4.00	10.0018

4. Low-Temperature Working Test for RJ711 Product

Experiment Purpose: To clarify the working performance of the product at low temperatures.

Low-Temperature Aging: Electronic products are placed in a set low-temperature environment of -50°C for 24 hours, then naturally warmed, observing and recording performance changes.

Serial Number	R0 (10KΩ) (KΩ)	R1 (10KΩ) (KΩ)	Change Rate (%)	R0 (10Ω) (Ω)	R1 (10Ω) (Ω)	Change Rate (%)
1	10.00058	10.00063	0.0005	10.0052	10.0045	-0.0070
2	10.00066	10.00067	0.0001	10.0042	10.0036	-0.0060
3	10.00035	10.00033	-0.0002	10.0042	10.0039	-0.0030
4	10.00026	10.00028	0.0002	10.0032	10.0025	-0.0070
5	10.00058	10.00062	0.0004	10.0038	10.0028	-0.0100

5. Short-Term Overload Test for RJ711 Product

Experiment Purpose: To clarify the product's resistance to electrical stress.

Method: Apply a 6.25x rated power shock for 5 seconds to the resistor, then test the resistance change.

Serial Number	R0 (3KΩ) (KΩ)	R1 (3KΩ) (KΩ)	Change Rate (%)	R0 (250Ω) (Ω)	R1 (250Ω) (Ω)	Change Rate (%)
1	2.99987	2.9999	0.0010	249.9948	249.9903	-0.0018
2	3.00016	3.00019	0.0010	250.0058	250.0041	-0.0007
3	3.00015	3.0001	-0.0017	249.9974	249.9963	-0.0004
4	3.00048	3.00051	0.0010	249.9929	249.9899	-0.0012
5	3.00019	3.00021	0.0007	249.9967	249.9954	-0.0005

6. Moisture Resistance Test for RJ711 Product

Experiment Purpose: To clarify the product's moisture-resistant packaging performance.

Double 85 Moisture Test: Conducted at 85°C and 85% relative humidity for 30 days, applying 0.1x rated power voltage (1 hour on/0.5 hour off).

Serial Number	R0 (1KΩ) (KΩ)	R1 (1KΩ) (KΩ)	Change Rate (%)
1	1.000048	1.000141	0.0091
2	1.000038	1.000124	0.0090
3	1.00006	1.000079	0.0021
4	1.000098	1.000019	0.0080
5	1.000014	0.999964	0.0050

7. Temperature Shock Resistance Test for RJ711 Product

Experiment Purpose: To clarify the product's resistance to environmental stress.

Conditions: Low temperature set at -50°C, high temperature set at 120°C, with each extreme temperature lasting no less than 15 minutes and temperature switching intervals of less than 5 minutes. A total of 100 cycles were conducted. After completion, resistance was measured and compared to the initial resistance before the test to observe changes.

Serial Number	R0 (3KΩ) (KΩ)	R5 (3KΩ) (KΩ)	R10 (3KΩ) (KΩ)	R20 (3KΩ) (KΩ)	R50 (3KΩ) (KΩ)	R100 (3KΩ) (KΩ)
1	2.99993	2.99983	3.00012	3.00014	3.00045	3.00018
2	2.99998	3.00007	3.00019	3.00042	3.00013	2.99998
3	2.99978	3.00007	3.00006	3.00041	3.00010	2.99978
4	2.99975	3.00005	3.00009	3.00036	3.00008	2.99975
5	2.99978	3.00007	3.00003	3.00043	3.00010	2.99978

Serial Number	R0 (250Ω) (Ω)	R5 (250Ω) (Ω)	R10 (250Ω) (Ω)	R20 (250Ω) (Ω)	R50 (250Ω) (Ω)	R100 (250Ω) (Ω)
1	250.0092	250.023	250.014	250.008	250.014	249.982
2	249.9824	249.989	249.984	249.972	249.985	249.981
3	249.9812	249.988	249.983	249.976	249.984	249.981
4	249.9842	249.992	249.988	249.981	249.989	249.984
5	249.9792	249.984	249.983	249.979	249.984	249.979

VIII: Electrical Aging Experiment:

Conduct long-term working life tests on finished products under conditions of 2000H, room temperature, 90MIN on, 30MIN off. Record resistance changes continuously at rated power.

Objectives:

Determine product failure modes: early failure, random failure, wear-out failure.

Determine the impact of product packaging on product working life. Early failure;

Experiment Date: March 6, 2024, to May 29, 2024

Serial Number	R0 (KΩ)	R250h (KΩ)	Change Rate	R500h (KΩ)	Change Rate	R1000h (KΩ)	Change Rate	R2000h (KΩ)	Change Rate
1	50.002478	50.002705	0.0005	50.00252	0.0001	50.002202	-0.0006	50.002208	-0.00054
2	50.002512	50.002866	0.0007	50.00228	-0.0005	50.002197	-0.0006	50.002203	-0.0006
3	50.004184	50.00445	0.0005	50.00431	0.0003	50.00481	0.0013	50.00486	0.00135
4	50.002597	50.002834	0.0005	50.00265	0.0001	50.003161	0.0011	50.003172	0.00114
5	50.002652	50.002964	0.0006	50.00344	0.0016	50.003291	0.0013	50.003302	0.0013

Serial Number	R0 (kΩ)	R250h (kΩ)	Change Rate	R500h (kΩ)	Change Rate	R1000h (kΩ)	Change Rate	R2000h (kΩ)	Change Rate
1	10.000361	10.000465	0.001	10.000465	0.001	10.000454	0.0009	10.000446	0.0008
2	10.000534	10.000609	0.0007	10.000669	0.0013	10.000623	0.0008	10.000575	0.0004
3	10.000665	10.000528	-0.0013	10.000528	-0.0013	10.000564	-0.001	10.000582	-0.0008
4	3.000172	3.000142	-0.001	3.000178	0.0002	3.000171	0	3.000171	0

Serial Number	R0 (KΩ)	R250h (KΩ)	Change Rate	R500h (KΩ)	Change Rate	R1000h (KΩ)	Change Rate	R2000h (KΩ)	Change Rate
1	0.9999192	0.9999215	0.0002	0.9999197	0.00005	0.9999172	-0.0002	0.9999169	-0.0002
2	0.9999173	0.9999287	0.001	0.9999289	0.00013	0.9999302	0.0013	0.9999357	0.0018
3	0.9999701	0.9999784	0.0008	0.9999849	0.001	0.9999850	0.0014	0.9999862	0.0016
4	0.9999783	0.9999815	0.0003	0.9999748	-0.0003	0.9999324	-0.004	0.9999596	-0.0018
5	0.9999189	0.9999213	0.0002	0.9999197	0.00008	0.9999176	-0.0001	0.9999172	-0.0002

Serial Number	R0 (KΩ)	R250h (KΩ)	Change Rate	R500h (KΩ)	Change Rate	R1000h (KΩ)	Change Rate	R2000h (KΩ)	Change Rate
1	249.9845	249.9851	0.0002	249.9854	0.0002	249.9859	0.0005	249.9878	0.001
2	249.9872	249.9877	0.0002	249.9877	0.0002	249.9879	0.00028	249.9891	0.0007
3	249.9827	249.9821	-0.0002	249.9820	-0.0003	249.9818	-0.0003	249.9817	-0.0003
4	249.9875	249.9856	-0.0007	249.9872	-0.0001